Reliability in CMOS VLSI circuits
Pankaj Kukkal, John B. Bowles · 2002
This paper presents some of the most important reliability techniques, and considerations associated with combinational CMOS VLSI circuits. The authors discuss reliability with regards to fault tolerance and testability. Topics discussed include common fault models, simulation of faults at the gate and layout level, test vector generation, redundancy techniques. and design-for-testability for combinational VLSI circuits.>