Built-In Hardware for Analog Circuitry Testing
Mansour H. Assaf, Maryam Fathi · 2008
Testing analog circuits is a challenging endeavor. The subject paper investigates the oscillation-based built-in self-test (OBIST) technique for testing the analog circuits. An analog circuit-testing environment based on the OBIST method is considered and implemented.Experimental results show that OBIST is a promising testing method for analog circuits which neither requires a stimulus generator nor a complex result analyzer.