Interconnect diagnosis of bus-connected multi-RAM systems
Jun Zhao, F.J. Meyer, Fabrizio Lombardi · 2003
This paper presents a novel approach for detection and diagnosis (with no confounding or aliasing) of interconnect faults (short and stuck-at) in a system consisting of multiple RAM chips connected through busses. These systems (referred to as a bus-connected multi RAM systems, or BCMRS) are characterized by multiple types of lines (bus and driver lines), disjoint busses (address and data) as well as by the presence of memories (whose number is given by D). Different testing objectives (detection and maximal diagnosis) are considered. An extensive analysis of the faults is pursued to characterize their impact on the BCMRS as well as on the test operations (such as WRITE and READ).