Computing stress tests for gate-oxide shorts
Vinay Dabholkar, Sourish Chakravarty · 2002
Reliability screens are used to reduce infant mortality. The quality of the stress test set used during the screening process has a direct bearing on the effectiveness of the screen. We present a formal study of the problem of computing good quality stress tests for gate-oxide shorts which is the cause of much of the reliability problems. A method to compute stress test which is better than the popular method of using I/sub DDQ/ vectors is presented.