Delay-line based embedded memory access time measurement: Circuit, implementation and characterization techniques
Moo Kit Lee, Wei Khoon Teng, Raj Kumar Krishnasamy, Wei Tee Ng · 2012
Embedded memory access time is an important parameter that determines the performance of the memory. To accurately characterize the embedded memory access time across Process, Voltage and Temperature (PVT) variation is always a challenge. In order to get more accurate memory access time data across PVT, the proper implementation of embedded memory access time measurement circuitry and characterization flow is required.