On partitioning for pseudo exhaustive testing of VLSI circuits
Wen B. Jone, C. Papachristou · 2003
The authors propose an algorithm to partition a given circuit into a set of subcircuits such that pseudoexhaustive self-testing will be possible. The algorithm is based on a graph-theoretic model using the concept of minimum vertex cut to maintain a tolerable hardware overhead. Experiment by computer simulation has been conducted and the results demonstrate that the proposed method is effective, particularly for circuits which are highly locally connected.>