Testing DSP cores based on self-test programs
Wenmin Zhao, C. Papachristou · 1998
This paper presents a new method for the testing of the datapath of DSP cores based on self-test program. During the test, random patterns areloaded into the core, exercise di#erent components of the core, and then areloaded out of the core for observation under the control of the self-test programs. We propose a systematic approach to generate the self-test program based on two metrics. One is the structural coverage and the other is the testability metric. Experimental results show the self-test program obtained by this approach can reach very high fault coverage in programmable core testing.