Embedded Self Repair by Transistor and Gate Level Reconfiguration
Rene Kothe, H.T. Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube · 2006
Technology forecasts predict that nanometer IC technologies do not yield large chip areas without non-functional transistors. Mechanism of redundancy and re-organization for self-repair at the transistor and gate level are required, which can effectively handle realistic fault effects in CMOS logic circuits