Minimum average cost testing for partially ordered components
Marc J. Lipman, Julia Abrahams · IEEE Transactions on Information Theory · 1995
The problem of designing a sequence of optimal binary tests for the identification of a single faulty component is addressed. For components in linear order this is equivalent to the classical alphabetic coding problem solved by Hu and Tucker (1971). For partially ordered components the problem is solved by reduction to a minimization over a set of alphabetic problems.>