Internal feedback bridging faults in combinational CMOS circuits: analysis and testing
Y. Nliura, Shuichi Seno · 2005
We analyze fault behaviors of intemal feedback bridging faults by using a simple circuit model consisting of 2-input NAND gate and NOT gate. From analysis results we find that they are more complex than those associated with extemal feedback bridging faults. We expose that they cause intemal oscillation and IDDQ-only failure as well as latch and oscillation behavior. We also discuss methods for detecting this kind of fault.