TEST GRADING THE 68332

Kwang-Ting Tim Cheng, E. Hoang, D. Rivera, A. Haedge, J. Fontenot, A.G. Carson · 2005

This paper presents a case study on test grading a modular design, the 68332, Motorola's 32-bit, 68000 family microcontroller. The modular design approach implemented for the 68332 is described along with the testing strategy and benefits of modular design. The tools and methodology used to perform the test grade and to preserve the test grade integrity are also presented. Factors are identifred that provided signijicant productivity improvements. The effects of each factor on the test grading effort are summarized based on the 68332 test grade experience.

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