A method to diagnose faults in linear analog circuits using an adaptive tester
Érika Cota, Luigi Carro, Marcelo Soares Lubaszewski · 1999
This work presents a new diagnosis method for use in an adaptive analog tester.The tester is able to detect faults in any linear circuit by learning a reference behavior in a first step, and comparing this behavior against the output of the circuit under test in a second step.Considering the same basic structure, the diagnosis method consists on injecting probable faults in a mathematical model of the circuit, and later comparing its output with the output of the real faulty circuit.This method has been successfully applied to a case study, a biquad filter.Component soft, large, and hard deviations, and faults in operational amplifiers were considered.The results obtained from practical experiments with this analog circuit are discussed in the paper.