Single bridging fault diagnosis for CMOS circuits
M. Olson, Xiaoling Sun · 2002
This paper presents a new algorithm for diagnosing gate level bridging faults in CMOS circuits. The algorithm employs a single fault assumption, and produces a significantly higher diagnostic resolution than that provided by previous algorithms. Extensive computer simulations are performed to illustrate the merits and feasibility of the new algorithm using the ISCAS85 benchmark circuits.