A novel sensitivity analysis technique for VLSI statistical design
Hing-Yan To, Hua Su, M. Ismail · 1996
A sensitivity analysis technique, which is derived from the two factorial design for experiment technique and a recently reported flexible statistical model, is presented. This technique detects the sensitivity of the performance of interest to random device parameter variations. It identifies the most sensitive transistors and quantifies the effect. The reliability of this technique is verified by Monte Carlo simulation.