A review of analog automatic test generation
H.H. Schreiber · 2005
Analog automatic test generation techniques are classified by the method of fault isolation utilized in implementation. These are fault analysis and fault dictionary, and are similar to the two branches of sta tistical inference: estimation (of actual network ele ment values from terminal measurements)'and hypoth esis testing (deciding which network element values have drifted out of tolerance), respectively. The clas ses also identify where in the fault isolation cycle com puter simulation takes place: fault analysis implies simulation after testing on the automatic test equip ment, whereas fault dictionary implies simulation prior to testing. Fault isolation methods known to be under investigation are discussed.