Gate delay fault test generation for non-scan circuits
G. van Brakel, Uwe Glaser, Hans G. Kerkhoff, H.T. Vierhaus · 1995
This article presents a technique for the extension of delay fault test pattern generation to synchronous sequential circuits without making use of scan techniques. The technique relies on the coupling of TDgen, a robust combinational test pattern generator for delay faults, and SEMILET, a sequential test pattern generator for several static fault models. The approach uses a forward propagation- backward justification technique: The test pattern generation is started at the fault location, and after successful "local " test generation fault effect propagation is performed and finally a synchronising sequence to the required state is computed. The algorithm is complete for a robust gate delay fault model, which means that for every testable fault a test will be generated, assuming sufficient time. Experimental results for the ISCAS'89 benchmarks are presented in this paper. 1