Weighted random robust path delay testing of synthesized multilevel circuits
W. Wang, Sandeep K. Gupta · 2002
Importance of delay testing is growing especially for high speed circuits. Delay testing using automatic test equipment is expensive. Built-in self-test can significantly reduce the cost of comprehensive delay testing by replacing the test equipment. It was found that several multilevel, synthesized, robust path delay testable circuits require impractically long pseudo-random test sequences. Weighted random testing techniques have been developed for robust path delay testing. The proposed technique is successfully applied to these circuits and 100% robust path delay fault coverage obtained using only 1-2 sets of weights.>