Strongly code-disjoint CMOS built-in intermediate voltage sensor for totally self-checking circuits

M.W.T. Wong, Joseph C. W. Pang, Y. S. Lee · International Journal of Electronics · 1999

In this paper, we describe a new approach to the design and the implementation of a strongly code-disjoint CMOS built-in intermediate voltage sensor (BIVS). The function of the BIVS is to detect any intermediate voltage caused by bridging faults in the functional circuit of a two-rail code totally self-checking system. It is shown that the proposed BIVS can detect and tolerate faults in itself. An application example employing the BIVS is used to show the effectiveness of the design.

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