Built-in self-diagnosis for scan-based VLSI
Xiaoling Sun, D. Ellert · 2002
This paper describes a novel built-in self-diagnosis scheme which utilizes the existing built-in self-test resources for IC-level STUMPS-like architectures. It is capable of identifying all flip-flops that have captured erroneous circuit responses during a test, independent of the number of errors in the circuit response sequences and the number of defects in a circuit under test (CUT).