Efficient fault ordering for automatic test pattern generation for sequential circuits
Peter A. Krauss, M. Henftling · 2002
This paper analyzes fault dependency in sequential circuits to accelerate parallel automatic test pattern generation (ATPG). We present the new algorithms improved fault collapsing and fault arranging for an efficient fault ordering to speedup ATPG. Experimental results obtained for sequential and fault parallel ATPG show the efficiency of the proposed methods.>