ATREX: Design for testability system for Mega Gate LSIs
Michiaki Emori, J. Kumagai, K. Itaya, Takashi Aikyo, T. Anan, J. Niimi · 2002
We propose a Design for Testability System for Mega Gate LSIs. This system meets various demands of designers, because this system has high flexibility. We show the flexibility by introducing some examples of circuit insertion which is supported by the system.