A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis
Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware · Proceedings/Proceedings - International Test Conference · 2006
This paper presents a flow for using logic diagnosis to turn production material into vehicles for yield learning. High throughput logic diagnosis is combined with the newly emerging field of design for manufacturing to enable layout aware diagnosis. The ability of the flow to calculate feature failure rates and the application of the failure rates for yield learning is demonstrated through volume data analysis on a production ASIC