Hardness assurance implications of bimodal total dose response in a bipolar linear voltage comparator
J.F. Krieg, T.L. Turflinger, Jeffery L. Titus, Patrick L. Cole, Pete C. Baker, M. Gehlhausen, D. Emily, L. Yang, Ronald L. Pease, Hugh Barnaby, Ronald D. Schrimpf, M.C. Maher · IEEE Transactions on Nuclear Science · 1999
The total dose response of transistors and circuits from a single wafer lot has been measured for high and low dose rate and elevated temperature irradiations. A bimodal irradiation response is observed in the circuit response that is shown to be a result of the input transistors. Hardness assurance sampling plans are examined for their adequacy to deal with the bimodal response distributions.