Non-classical Fault Detection In Dynamic CMOS
M. Singh, A. Arunachalam · 2005
Due to increased complexity, testing and fault detecting have acquired lot of importance in modern VLSI technology. CMOS and specially dynamic CMOS logic families are widely used in present day VLSI circuits. This paper focuses on one such family called the Domino Logic and analyses the issue of fault detection. Instead of studying the conventional stuck at faults, it investigates the nonclassical stuck open and stuck on faults. Stuck on faults in the Domino circuit are harder to detect and additional transistors may be used to alleviate the difficulty.