MD-SCAN method for low power scan testing
Takayuki Yoshida, Masafumi Watari · 2003
As semiconductor manufacturing technology advances, power dissipation and noise in scan testing have become critical problems. Our studies on practical LSI manufacturing show that power supply voltage drop causes testing problems during shift operations in scan testing. In this paper, we present a new testing method named MD-SCAN (multi duty-scan) which solves power supply voltage drop problems, as well as its experimental results applied to practical LSI chips.