Perspectives of combining online and offline test technology for dependable systems on a chip
C. Galke, M. Grabow, H.T. Vierhaus · 2004
Silicon IC technology is entering a new stage of development with the arrival of structures below 100 nm. Such devices are volatile to external radiation effects caused by radioactive particles. Hence circuits in safety critical applications must be self-testing and self-correcting. Production test for complex ICs in deep sub-micron technology is also becoming impossible without built-in self test technology. In this paper, we try to analyze in how far self-test technology for production test and for online self test can be combined for reducing the overall overhead for testing.