Large-signal transistor device measurement
Kim Fung Tsang, Chuan Tang, Peter C. L. Yip, G.B. Morgan, W. S. Chan · 2002
A new method for characterizing transistors operating in the nonlinear region has been presented by some of the present authors (See Proceedings Intern. AMSE Conference Signals & Systems, vol.3, p.105-111, Sept., 1990). In this paper, more measurement results are presented to verify the feasibility of the method developed. The trends of variation of large signal S-parameters at different power levels are shown.>