Test and repair of large embedded DRAMs. I
R. McConnell, Rochit Rajsuman · 2002
Embedded DRAM offers major advantages in terms of system integration on-chip. However, the fabrication process requires special attention for profitable manufacturing, particularly in the area of test and repair. We present the benefits which embedded DRAM offers, and then move to test issues. We provide an analysis of the technical and financial impact of different test approaches, and discuss which considerations are important in choosing a test strategy.