Design of pseudoexhaustive testable PLA with low overhead
W.-Z. Shen, G.-H. Hwang, Wen-Jun Hsu, Yun-Jung Jan · IEEE Transactions on Computers · 1993
The pseudoexhaustive testing (PET) scheme is an economical approach to testing a large embedded programmable logic array (PLA). The authors propose an efficient algorithm named low overhead PET (LOPET) to partition the product lines. By applying this algorithm, both the area overhead and test length are reduced significantly.>