A testable static RAM structure for efficient coverage of pattern sensitive faults
Shyang-Tai Su, Rafic Z. Makki · 2003
The authors present a new SRAM test technique that can reduce the test complexity from O(n/sup 2/) to 5n for detecting pattern sensitive faults. A new design-for-test scheme is employed which makes possible the use of current monitoring techniques for detecting pattern sensitivity. A simple test sequence such as a cell stuck-at test can be employed to yield the same coverage of disturbs as complex test sequences such as Gallop.>