Implementation of the transient response measurement of mixed-signal circuits
Peter R. Shepherd, A. Bertin, Mahmoud Al‐Qutayri · 2002
This paper presents the practical realisation of the transient response analysis proposed previously (1990, 1991) for the testing of mixed analogue/digital circuits. In this measurement system the circuit under test (CUT) is stimulated by a series of pulses in the form of a pseudo random binary sequence (PRBS). The transient response of the circuit is captured using a high speed analogue-digital converter and then transferred to a computer for subsequent signal analysis. The hardware system is described and results presented for both analogue and mixed signal circuits.>