A vector-based approach for power supply noise analysis in test compaction
Jing Wang, Ziding Yue, Xiang Lü, Wangqi Qiu, Weiping Shi, D.M.H. Walker · 2006
Excessive power supply noise can lead to overkill during delay test. A static test vector compaction solution is described to prevent such overkill. Low-cost power supply noise models are developed and used in compaction. An error analysis of these models is given. This paper improves on prior work in terms of models and algorithm to increase accuracy and performance. Experimental results are given on ISCAS89 circuits