DSP Driven Parallel EVM Testing of Embedded MIMO-OFDM RF Modules
Shyam Kumar Devarakond, Debashis Banerjee, A. Banerjee, Shreyas Sen, Abhijit Chatterjee · 2012
In this paper, we present a low-cost methodology for parallel testing of MIMO-OFDM RF modules using optimized bandwidth-partitioned frequency domain stimulus applied from the embedded DSP module of the MIMO-OFDM system and a simple combination of sensors on the load board. A comprehensive set of specifications of multiple RF modules chains are computed simultaneously from the observed DUT response using a single data acquisition. This allows MIMO-RF chains to be tested efficiently with lower test cost and test time as compared to prior test techniques. Experimental results provided for a 2.4 GHz transmitter showcase the ability of the presented technique to compute the RF specifications accurately.