On diagnosis of faults in a scan-chain
Sandip Kumar Kundu · 2002
Testing screens for good chips. However, when test fall out is high (low yield) it becomes necessary to diagnose faults so that the manufacturing process or physical design can be fixed to improve yield. Several scan based diagnostic schemes are used in industry. They work when the scan chain itself is fault free. This paper describes a diagnosis system that can diagnose faults in a scan chain.>