A new high level testability measure: description and evaluation
M.-H. Gentil, Didier Crestani, Abdennour El Rhalibi, Caterina Durante · 2002
A high testability measure based on constraints propagation and dedicated to deterministic test of the combinational part of scannable circuits is compared to three others high level testability measures of the literature. This measure is used to guide hierarchical generation of test vectors and automatic test point insertion.>