Fault diagnosis and calibration of large analog circuits
Janusz A. Starzyk, H. Dai · 2003
A method to test and calibrate linear circuits is proposed. A tested circuit is partitioned at nodes where the voltage measurements are taken. Test equations are formulated on the basis of Kirchoff's current law equations at the partition points. This results in the Jacobian matrix with a sparse block structure. The test points selection and the element evaluation can be performed in parallel, reducing computation time and enhancing the test performance.>