Advances on yield learning through concurrent evaluation of design and process data
Davide Appello, Vincenzo Tancorre, Christophe Suzor, Michael Hall, Salvatore Talluto, Sagar A. Kekare · 2009
This paper presents advances in methodologies and tools for yield learning which are concurrently exploiting design, test and process data. In our experiments, we demonstrated how to understand yield losses correlated with excessive power drawn from the chip during functional electrical test of wafers.