Silicon evaluation of faster than at-speed transition delay tests
S. Chakravarty, Narendra Devta-Prasanna, Arun Gunda, Junxia Ma, Fan Yang, Hang Guo, R. Lai, Dianqiang Li · 2012
Researchers, based primarily on theoretical analysis of different coverage metric, have proposed the need to cover small delay defect (SDD). There is very little silicon data justifying the need to add SDD tests to the manufacturing flow. This paper attempts to fill this gap. A high volume manufacturing experiment to ascertain the added screening capability of defective parts and infant mortality of FAST_TDF tests are described. Quantitative silicon data are presented.