Techniques to increase sequential ATPG performance
Enrico Macii, Angelo Raffaele Meo · 2003
An automatic test pattern generation (ATPG) system for sequential circuits is described. Techniques such as testability measures, 9-valued functions, incompatibility function and fault simulation have been added to the basic algorithm in order to increase the fault coverage and reduce the test generation time. The entire ATPG system has been benchmarked on the set of ISCAS89 circuits.>