On Capture Power-Aware Test Data Compression for Scan-Based Testing
Jia Li, Xiao Liu, Yubin Zhang, Xiaowei Li, Qiang Xu · 2009
Large test data volume and high test power are two of the major concerns for the industry when testing large integrated circuits. With given test cubes in scan-based testing, the “don’t-care ” bits can be exploited for test data compression and/or test power reduction. Prior work either targets only one of these two issues or considers to reduce test data volume and scan shift power together. In this paper, we propose a novel capture power-aware test compression scheme that is able to keep scan capture power under a safe limit with little loss in test compression ratio. Experimental results on benchmark circuits demonstrate the efficacy of the proposed approach.