Using embedded objects for yield monitoring
G. Bazan, F. Gravel, Leendert M. Huisman, A. Pardee, Leah Pastel, Kerry M. Rowe · 2004
In this article, we describe the use of embedded objects, such as scan chains and RAMs, for yield learning and as defect monitors. We discuss why these objects are suitable for yield learning, and what needs to be done to use them as such. We close with a number of examples, showing the use of embedded chains to improve yield.