A cut-based method for terminal-pair reliability
Y.G. Chen, Maria C. Yuang · IEEE Transactions on Reliability · 1996
This paper assesses two categories of partition techniques for computing terminal-pair reliability (path-based and cut-based algorithms) by experimenting on published benchmarks; the criteria are the number of subproblems and the computation time. The cut-based algorithm is superior to the path-based algorithm with respect to the computation time for most benchmarks. A refinement of the cut-based algorithm (using network reduction) profoundly outperforms the path-based algorithm (with reduction) for all benchmarks.