Electron beam tester aided fault diagnosis for logic circuits based on sensitized paths
N. Yanagida, Hiroshi Takahashi, Yuzo Takamatsu · 2002
In this paper, we propose an electron beam tester (EB-tester) aided fault diagnosis for combinational and sequential circuits based on sensitized paths. For combinational circuits, we enhance the previous set of sensitizing input pairs and present EB-tester aided fault diagnosis. For sequential circuits, we introduce a measure for selecting internal lines to be probed and present EB-tester aided fault diagnosis. Experimental results of ISCAS'85 and ISCAS'89 benchmark circuits show the efficiency of the presented methods.