Low cost analogue testing of RF signal paths
Marcelo Negreiros, Luigi Carro, Altamiro Susin · Design, Automation, and Test in Europe · 2004
A low cost method for testing analogue RF signal paths suitable for BIST implementation in a SoC environment is described. The method is based on the use of a simple and low-cost one-bit digitizer that enables the reuse of processor and memory resources available in the SoC, while incurring little analogue area overhead. The proposed method also allows a constant load to be observed by the circuit, since no switches or muxes are needed for digitizing specific test points. Mathematical background and experimental results are presented in order to validate the test approach.