ON THE ACCELERATION OF TEST GENERATION ALGORlTHMS
Hideo Fujiwara, T. Shimono · 2005
In order to accelerate an algorithm for test generation, it is necessary to reduce the number of backtracks in the algorithm and to shorten the process time betmeen backtracks. consider severa2 techniques to accelerate test generation and present a new test generation algorithm called FAN (FANout-oriented test generation algorithm). It is shown that FAN algorithm is faster and more efficient than the PODEM azgorithm reported by Goel. We also present an automatic test generation system composed of the FAN algorith and the concurrent fault simulation. sults on large combinational circuits of up to 3000 gates demonstrate that t he system perfoms test generation very fast and effectively. In this paper #e