Subpixel edge detection and estimation with a microprocessor-controlled line scan camera
Yufei Li, Tzay Y. Young, J.A. Magerl · IEEE Transactions on Industrial Electronics · 1988
A microprocessor-controlled line scan camera system for measuring edges and lengths of steel strips is described, and the problem of subpixel edge detection and estimation in a line image is considered. The edge image is assumed to change gradually in its intensity, and the true edge location may be between pixels. Detection and estimation of edges are based on measurement of gray values of the line images at a limited number of pixels. A two-stage approach is presented. At the first stage, a computationally simple discrete-template-matching method is used to place the estimated edge point to the nearest pixel value. Three second-stage methods designed for subpixel estimation are examined. The modified Chebyshev polynomial and the three-point interpolation method do not require much knowledge on the shape of the edge intensity. If the functional form of the edge is known, a least-square estimation method may be used for better accuracy. In the case of nonstationary Poisson noise, a recursive maximum-likelihood method for the first-stage edge detection, followed by subpixel estimation, is proposed.>