A new pseudo-exhaustive test method
Jhing-Fa Wang, Weilun Wang, Tzyy-Kuen Tien · 2002
An efficient and systematic pseudo-exhaustive test pattern generation algorithm has been proposed in this paper to solve the problem of test generation in BIST. The algorithm has the following advantages: (1) it requires a minimum number of test signals for testing a circuit (2) it executes quickly with polynomial time complexity (3) it requires fewer test patterns and low hardware cost compared to five previous proposed methods.>