Test generation for maximizing ground bounce for internal circuitry with reconvergent fan-outs
Yi-Shing Chang, Sandeep K. Gupta, M.A. Breuer · 2002
Due to technology scaling and increasing clock rate, problems due to noise effects lead to an increase in design and test efforts and a decrease in circuit performance. This paper addresses the problem of efficiently and effectively generating two vector tests to produce the maximum ground bounce in a circuit. We have developed a branch and bound procedure that can find a good quality test for maximum ground bounce in a rather short time. Comparison of results with SPICE simulations confirms the quality of tests obtained by our procedure.