Distributed automatic test pattern generation
Tuck-Boon Chan · 2003
An automatic test pattern generation (ATPG) program which can partition the logic and stuck-at faults of any scan-based ASIC into disjoint sets is described. These logic partitions and fault sets are processed concurrently over a computing network. The performance of the ATPG is improved significantly, and it can handle very large ASICs.>