Domain Crossing Errors: Limitations on Single Device Triple-Modular Redundancy Circuits in Xilinx FPGAs
Heather Quinn, Keith Morgan, Paul Graham, Jim Krone, Michael P. Caffrey, Kevin Lundgreen · IEEE Transactions on Nuclear Science · 2007
This paper discusses the limitations of single-FPGA triple-modular redundancy in the presence of multiple-bit upsets on Xilinx Virtex-II devices. This paper presents results from both fault injection and accelerated testing. From this study we have found that the configurable logic block's routing network is vulnerable to domain crossing errors, or TMR defeats, by even 2-bit multiple-bit upsets.